Archiwum autora: Arkadiusz

Two of our colleagues attended SPIE Optical Metrology 2023 conference, held on 26-29 June in Munich, Germany. Michał Gontarz (on the left in the photo) presented a paper entitled „Deep learning-based phase unwrapping for holographic tomography„ Arkadiusz Kuś (in the middle of the photo) presented a paper entitled „Single-shot polarization phase shifting interferometry applied to… Dowiedz się więcej »