SPIE Optical Metrology 2023

przez | 25 lipca, 2023
Meeting with Bjoern Kemper at World of Photonics Trade Fair in Munich

Two of our colleagues attended SPIE Optical Metrology 2023 conference, held on 26-29 June in Munich, Germany.

Michał Gontarz (on the left in the photo) presented a paper entitled „Deep learning-based phase unwrapping for holographic tomography

Arkadiusz Kuś (in the middle of the photo) presented a paper entitled „Single-shot polarization phase shifting interferometry applied to studying ampicillin diffusion through Pseudomonas aeruginosa biofilm

Welcome reception

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