New Trends in Metrology, Lublin 2022
Prof. Małgorzata Kujawińska was invited to give a plenary talk about „Metrology at 3D Quantitative Phase Imaging at cellular level” on New Trends in Metrology conference in Lublin.
Prof. Małgorzata Kujawińska was invited to give a plenary talk about „Metrology at 3D Quantitative Phase Imaging at cellular level” on New Trends in Metrology conference in Lublin.
Prof. Kujawińska was invited to be a part of 25th Congress ICO of WOLS and to give a talk about „Metrological aspects of Quantitative Phase Imaging”.
Our leader prof. Małgorzata Kujawińska took part in conferencie SPIE Optics & Photonics in San Diego, 21-25 August 2022 and presented work „Metrological assessment of reconstruction accuracy in holographic tomography”.
Our colleague Maria Baczewska took part in conference Digital Holography and Three-Dimentional Imaging and presented her work on „Herbal compounds influence on refractive index of neuroblastoma cells based on holographic tomography measurements”.
Our colleague Arkadiusz Kuś took part in World’s Leading Trade Fair with Congress for Photonics Components, Systems and Applications 2022 in Munchen. He presented our tomographic system.
21st March 2022 there was first Demo Center Session held in our Institute as a part of PhotonHub Europe.
Maria Baczewska from our team presented her work on „On-chip holographic tomography for quantifying refractive index changes of cells’ dynamics” during Quantitative Phase Imaging VIII conference, Photonics West BIOS.
Our team member Michał Ziemczonok took part in a meeting with Brussels Photonics Group in VUB, Belgium.
Our collegue Maria Baczewska presented her work on European Confeerences on Biomedical Optics, wchich was held online, 20-24 June 2021. Title of the presentation was „Quantitative, label-free measurements of cells after light exposure”.
The SPIE Dennis Gabor Award in Diffractive Optics recognizes outstanding accomplishments in diffractive wavefront technologies, especially those that further the development of holography and metrology applications.